2009

Field Emission Scanning Electron Microscope

altNovelx (Lafayette, CA) introduces the mySEM® compact field emission scanning electron microscope (SEM) for imaging and characterizing nanoscale objects and materials. In a compact design that installs easily, the mySEM is optimized for low-voltage operation and delivers sub-10nm imaging capabilities. With no need to coat non-conductive samples and providing up to 65,000x magnification, the mySEM is suitable for the nanoscale imaging of energy sensitive samples, biomaterials, and thin films. The mySEM enables users to select a specific operating voltage between 0.5 to 2.0 kV.

For Free Info Visit http://info.hotims.com/22920-209

White Papers

Building a Test System for High-Speed Data Streaming Applications
Sponsored by ADLINK Technology
Reverse Engineering
Sponsored by Servometer
Data Cabling for Today’s and Tomorrow’s Aircraft
Sponsored by Thermax
Managing Risk in Medical Connectors
Sponsored by Fischer Connectors
Connectors Outperform Fardwiring for Manufacturers and Their Customers
Sponsored by Harting
The Basics Of Pressure Regulators
Sponsored by Beswick

White Papers Sponsored By: