2009

Field Emission Scanning Electron Microscope

altNovelx (Lafayette, CA) introduces the mySEM® compact field emission scanning electron microscope (SEM) for imaging and characterizing nanoscale objects and materials. In a compact design that installs easily, the mySEM is optimized for low-voltage operation and delivers sub-10nm imaging capabilities. With no need to coat non-conductive samples and providing up to 65,000x magnification, the mySEM is suitable for the nanoscale imaging of energy sensitive samples, biomaterials, and thin films. The mySEM enables users to select a specific operating voltage between 0.5 to 2.0 kV.

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