Thin Film Measurement Instrument
- Thursday, 01 October 2009
The Craic Technologies QDI 2010 FilmTM is available from Elliot Scientific (Hertfordshire, UK). The QDI 2010 Film is a specialized instrument developed from the existing QDI 2010 UV-VIS-NIR microspectrophotometer, combining UV microscopy and microspectroscopy into one tool. The QDI 2010 Film can measure the thickness of thin films covering sub-micron or larger sampling areas, by either transmission or reflectance in a rapid and non-destructive fashion. The instrument can analyze the film on both transparent and opaque substrates.
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