Metrology Systems

altLehighton Electronics, Lehighton, PA, has introduced the 1800 series systems for the characterization of solar cells and flat-panel displays. The systems feature full automation and control, and incorporate sensor heads for in-line product monitoring. Fully automated conveyor models monitor uniformity of ITO, TCO, various thin films, and other coatings on non-conductive substrates. Optional Statistical Process Control software provides a warning when uniformity or sheet-resistance measurements are out of the desired range. The series is designed for characterization of products such as wafers up to 450 mm diameter, coated glass panels, and solar cells.

For Free Info Visit http://info.hotims.com/22926-160

White Papers

Simulation of Coupled Electromagnetic/Thermal Systems using CAE Software
Sponsored by IES
An Introduction to LED Capabilities
Sponsored by Photo Research
Electroforming Basics
Sponsored by Servometer
Improving Cable Performance in Harsh Environments
Sponsored by Gore
Introduction to Hypervisor Technology
Sponsored by Curtiss-Wright Controls Embedded Computing
Learn LED Test Techniques
Sponsored by Keithley

White Papers Sponsored By: