2009

Metrology Systems

altLehighton Electronics, Lehighton, PA, has introduced the 1800 series systems for the characterization of solar cells and flat-panel displays. The systems feature full automation and control, and incorporate sensor heads for in-line product monitoring. Fully automated conveyor models monitor uniformity of ITO, TCO, various thin films, and other coatings on non-conductive substrates. Optional Statistical Process Control software provides a warning when uniformity or sheet-resistance measurements are out of the desired range. The series is designed for characterization of products such as wafers up to 450 mm diameter, coated glass panels, and solar cells.

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