2009

Effects of Temperature on Polymer/Carbon Chemical Sensors

Experiments were conducted on the effects of temperature, polymer molecular weight, and carbon loading on the electrical resistances of polymer/carbon-black composite films. The experiment were performed in a continuing effort to develop such films as part of the JPL Electronic Nose (ENose), that would be used to detect, identify, and quantify parts-per-million (ppm) concentration levels of airborne chemicals in the space shuttle/space station environments. The polymers used in this study were three formulations of poly(ethylene oxide) [PEO] that had molecular weights of 20 kilodaltons, 600 kilodaltons, and 1 megadalton, respectively.

The results of one set of experiments showed a correlation between the polymer molecular weight and the percolation threshold. In a second set of experiments, differences among the temperature dependences of resistance were observed for different carbon loadings; these differences could be explained by a change in the conduction mechanism.

In a third set of experiments, the responses of six different polymer/ carbon composite sensors to three analytes (water vapor, methanol, methane) were measured as a function of temperature (28 to 36°C). For a given concentration of each analyte, the response of each sensor decreased with increasing temperature, in a manner different from those of the other sensors.

This work was done by Allison Manfreda, Liana Lara, April Jewell, Margie Homer, Shiao-Pin Yen, Adam Kisor, Margaret Ryan, Hanying Zhou, Abhijit Shevade, and Lim James of Caltech and Kenneth Manatt of Santa Barbara Applied Research for NASA’s Jet Propulsion Laboratory.

In accordance with Public Law 96-517, the contractor has elected to retain title to this invention. Inquiries concerning rights for its commercial use should be addressed to:

Innovative Technology Assets Management
JPL
Mail Stop 202-233
4800 Oak Grove Drive
Pasadena, CA 91109-8099
(818) 354-2240
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Refer to NPO-40621, volume and number of this NASA Tech Briefs issue, and the page number.