Luna Technologies (Roanoke, VA) has introduced the Optical Vector Analyzer platform, (OVA 5000), a tool for loss, dispersion, and polarization measurements of modern optical networking equipment. It delivers single- measurement, all-parameter analysis of fiber optic components and assemblies up to 150 meters in length. A full C and L band characterization of all linear optical parameters can be completed in less than three seconds. The OVA uses swept-wavelength interferometry to measure all device characteristics in a single scan of a tunable laser. It characterizes all linear optical parameters including: Insertion Loss (IL), Polarization Dependent Loss (PDL), Group Delay (GD), Chromatic Dispersion (CD), Polarization Mode Dispersion (PMD), and Second Order PMD.
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This week's Question: The Korea Herald reported last week that Samsung is developing a "fold-in" phone. The device's flexible display folds open into a 7-inch tablet. According to the article, the team is expected to ship more than 100,000 units...
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