2010

Microscope Sample Stretching Stage

altAsylum Research (Santa Barbara, CA) has announced the new NanoRack™ Sample Stretching Stage Accessory for its MFP-3D™ atomic force microscopes (AFMs). This high-strain, high-travel manual stretching stage provides two axis stress control of tensile loaded samples under different loads. Automatic load cell calibration provides integrated force measurements with MFP-3D images or other measurements, and returns both stress and strain data. Maximum sample load is 80N. The stage is compatible with a wide variety of AFM imaging techniques including Phase and Dual AC™ for enhanced contrast of material properties, as well as the MFP-3D’s Ztherm™ option for localized thermal analysis.

Click here to learn more.

White Papers

Windows CE Development for RISC Computers Made Easy
Sponsored by Sealevel
Recruit Or Retain Report
Sponsored by Aerotek
Estimating the Effort and Cost of a DO-254 Program
Sponsored by Logic Circuit
Electronics Subracks: Requirements, Selection Criteria And Options For Adaptation
Sponsored by Pentair
IEC 61131-3 Now in Motion
Sponsored by Trio Motion
Finding the Right Manufacturer for Your Design
Sponsored by Sunstone Circuits

White Papers Sponsored By: