2010

MEMS Inclinometer

altTURCK (Minneapolis, MN) offers the Q42 dual-axis inclinometer sensor with a CANopen interface for angular tilt detection, and angle measurements of ±10, 45, and 60 degrees. The device measures angular tilt in reference to gravity. It features a MEMS device that incorporates a microelectromechanical capacitive element into the sensor that utilizes two parallel plate electrodes — one stationary and one attached to a spring-mass system. Movement causes acceleration that produces deflection in the non-stationary electrode. This results in a measureable change in the capacitance between the two plates that is proportional to the angle of deflection. All measured values and parameters are accessible via the object directory. The micro board design in the MEMS technology allows for a compact device in an industrialized package.

For Free Info Visit http://info.hotims.com/28060-312

White Papers

X-Ray Imaging: Emerging Digital Technology - CMOS Detectors
Sponsored by Teledyne DALSA
Expanding GNSS Testing with Multiple Synchronized Signal Recorders
Sponsored by Averna
Removing the Gap Between ECAD and MCAD Design
Sponsored by Mentor Graphics
Putting FPGAs to Work in Software Radio Systems
Sponsored by Pentek
Finding the Right Manufacturer for Your Design
Sponsored by Sunstone Circuits
Internet of Things
Sponsored by HP

White Papers Sponsored By: