Product of the Month: Solar Simulation Measurement Tool
Created: Saturday, 01 January 2011
Oriel® (Stratford, CT)
has announced a new uniformity measurement
tool for measuring the
uniformity of irradiance
at the sample plane of
solar simulators. The
new PV tool is equipped
with a single metal test
platen, compatible with English/metric table mounts, and with all
3 test standards: IEC, ASTM and JIS. A detector head is provided
with appropriate masking to the area defined by either the IEC or
the JIS method, depending on the model. The system is designed
to correctly place the test detector head in 17 predetermined positions
as defined by JIS standard C8912, or in 64 equally-spaced positions,
defined by IEC method 60904-9. The intuitive MUMS software
package provides 2D and 3D surface plots to analyze XYZ
positioning of the lamp to quickly attain optimal irradiance uniformity.
Photonics West Booth #1301
For Free Info Visit http://info.hotims.com/34450-205
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