A 200kV transmission electron microscope from JEOL (Peabody,
MA) delivers nanoanalysis for process and quality control of mass-produced
semiconductor and materials samples. The multi-function JEOL
JEM-2800 features high resolution imaging in TEM, STEM, and SE
modes; ultrasensitive elemental mapping with a large angle Energy Dispersive
Spectrometer (EDS); Electron Energy Loss Spectroscopy
(EELS) for chemical analysis; critical dimension analysis; tomography;
and in situ observation of samples. The TEM functions without use of
the traditional fluorescent screen on the electron column. The JEM-2800 speeds
specimen observation through automatic functions including adjustment of focus, astigmatism,
contrast, brightness, crystal zone axis alignment, and height. The JEM-2800 has an operator navigation
system and on-screen operating guide. Additional features and key specifications of the
JEM-2800 include a Schottky field-emission electron gun; stable eucentric side-entry goniometer
stage; a magnification range of 100x to 150,000,000x using STEM; 0.1nm TEM resolution; and
0.20nm BF/DF STEM resolution.
For Free Info Visit http://info.hotims.com/34460-211
This week's Question: Fox Sports offered virtual-reality streams from last week's U.S. Open, a major golf championship in Oakmont, PA. Sports fans who owned the right devices could watch the golf event on the television while using VR for...
Subscribe today to receive the INSIDER, a FREE e-mail newsletter from NASA Tech Briefs featuring exclusive previews of upcoming articles, late breaking NASA and industry news, hot products and design ideas, links to online resources, and much more.