A 200kV transmission electron microscope from JEOL (Peabody, MA) delivers nanoanalysis for process and quality control of mass-produced semiconductor and materials samples. The multi-function JEOL JEM-2800 features high resolution imaging in TEM, STEM, and SE modes; ultrasensitive elemental mapping with a large angle Energy Dispersive Spectrometer (EDS); Electron Energy Loss Spectroscopy (EELS) for chemical analysis; critical dimension analysis; tomography; and in situ observation of samples. The TEM functions without use of the traditional fluorescent screen on the electron column. The JEM-2800 speeds specimen observation through automatic functions including adjustment of focus, astigmatism, contrast, brightness, crystal zone axis alignment, and height. The JEM-2800 has an operator navigation system and on-screen operating guide. Additional features and key specifications of the JEM-2800 include a Schottky field-emission electron gun; stable eucentric side-entry goniometer stage; a magnification range of 100x to 150,000,000x using STEM; 0.1nm TEM resolution; and 0.20nm BF/DF STEM resolution.
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This week's Question: In recent years, hundreds of millions of dollars have been invested into space ventures. SpaceX, an advanced spacecraft manufacturer founded by Elon Musk, has completed more than 30 successful launches since 2006, delivered...
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