A 200kV transmission electron microscope from JEOL (Peabody,
MA) delivers nanoanalysis for process and quality control of mass-produced
semiconductor and materials samples. The multi-function JEOL
JEM-2800 features high resolution imaging in TEM, STEM, and SE
modes; ultrasensitive elemental mapping with a large angle Energy Dispersive
Spectrometer (EDS); Electron Energy Loss Spectroscopy
(EELS) for chemical analysis; critical dimension analysis; tomography;
and in situ observation of samples. The TEM functions without use of
the traditional fluorescent screen on the electron column. The JEM-2800 speeds
specimen observation through automatic functions including adjustment of focus, astigmatism,
contrast, brightness, crystal zone axis alignment, and height. The JEM-2800 has an operator navigation
system and on-screen operating guide. Additional features and key specifications of the
JEM-2800 include a Schottky field-emission electron gun; stable eucentric side-entry goniometer
stage; a magnification range of 100x to 150,000,000x using STEM; 0.1nm TEM resolution; and
0.20nm BF/DF STEM resolution.
For Free Info Visit http://info.hotims.com/34460-211
This week’s Question: The Department of Energy (DOE) has set a goal of building a battery that stores energy for less than $100 per kilowatt-hour, making stored wind and solar energy competitive with energy produced from traditional power plants....
Subscribe today to receive the INSIDER, a FREE e-mail newsletter from NASA Tech Briefs featuring exclusive previews of upcoming articles, late breaking NASA and industry news, hot products and design ideas, links to online resources, and much more.