A 200kV transmission electron microscope from JEOL (Peabody,
MA) delivers nanoanalysis for process and quality control of mass-produced
semiconductor and materials samples. The multi-function JEOL
JEM-2800 features high resolution imaging in TEM, STEM, and SE
modes; ultrasensitive elemental mapping with a large angle Energy Dispersive
Spectrometer (EDS); Electron Energy Loss Spectroscopy
(EELS) for chemical analysis; critical dimension analysis; tomography;
and in situ observation of samples. The TEM functions without use of
the traditional fluorescent screen on the electron column. The JEM-2800 speeds
specimen observation through automatic functions including adjustment of focus, astigmatism,
contrast, brightness, crystal zone axis alignment, and height. The JEM-2800 has an operator navigation
system and on-screen operating guide. Additional features and key specifications of the
JEM-2800 include a Schottky field-emission electron gun; stable eucentric side-entry goniometer
stage; a magnification range of 100x to 150,000,000x using STEM; 0.1nm TEM resolution; and
0.20nm BF/DF STEM resolution.
For Free Info Visit http://info.hotims.com/34460-211
This week's Question: MIT recently unveiled its prototype design for SpaceX founder Elon Musk's Hyperloop, a high-speed ground transport system that could theoretically send passengers from Los Angeles to San Francisco in half an hour. The...
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