A document discusses a new parity pupil mask design that allows users to unambiguously determine the image space coordinate system of all the James Webb Space Telescope (JWST) science instruments by using two out-of-focus images. This is an improvement over existing mask designs that could not completely eliminate the coordinate system parity ambiguity at a wavelength of 5.6 microns. To mitigate the problem of how the presence of diffraction artifacts can obscure the pupil mask detail, this innovation has been created with specifically designed edge features so that the image space coordinate system parity can be determined in the presence of diffraction, even at long wavelengths.

This work was done by Brent Bos for Goddard Space Flight Center. GSC-15956-1

White Papers

Force Sensors For Design
Sponsored by Tekscan
The Ultimate Shaft-To-Hub Connection
Sponsored by Stoffel Polygon
Getting The Most Out Of Metal 3D Printing: Understanding Design & Process Controls For DMLS
Sponsored by Stratasys Direct Manufacturing
Full-Wave Matching Circuit Optimization Shortens Design Iterations
Sponsored by Remcom
HAIs and Chemical Resistance
Sponsored by Eastman
Design Guide: Sheet Metal Fabrication
Sponsored by Xometry

White Papers Sponsored By:

The U.S. Government does not endorse any commercial product, process, or activity identified on this web site.