2012

Vacuum Spectrometer

The Model 248/310 grazing incidence spectrometer from McPherson (Chelmsford, MA) makes direct optical measurements from one to 300 nanometers. The device enables testing of soft x-ray (XUV) high energy light sources (plasma or laser) and samples. Life time, persistence, or decay can be measured with continuous spectral scanning.

altA new “up” scanning feature combines the 789A-3 digital drive and 248/310 spectrometer system accessories. Soft- or hardware triggers coordinate data collection at specific wavelengths. Software, backed up by hardware, sets the wavelength scan region. An optional adjustable end switch system for the 248/310 is available. The vacuum spectrometers have focal lengths of 0.2 to two meters and more.

For Free Info Visit http://info.hotims.com/40433-214

White Papers

Force and Torque Measurement Traceability
Sponsored by Morehouse
Sensors For Use In Aerospace, Military and Industrial Markets
Sponsored by Columbia Research
X-Ray Imaging: Emerging Digital Technology - CMOS Detectors
Sponsored by Teledyne DALSA
Reverse Engineering
Sponsored by Servometer
CFD for Mechanical Design Engineers - “A Paradigm Shift for Better Design”
Sponsored by Mentor Graphics
Learn LED Test Techniques
Sponsored by Keithley

White Papers Sponsored By: