Variable Sampling Mapping

The performance of an optical system (for example, a telescope) is limited by the misalignments and manufacturing imperfections of the optical elements in the system. The impact of these misalignments and imperfections can be quantified by the phase variations imparted on light traveling through the system. Phase retrieval is a methodology for determining these variations. Phase retrieval uses images taken with the optical system and using a light source of known shape and characteristics. Unlike interferometric methods, which require an optical reference for comparison, and unlike Shack-Hartmann wavefront sensors that require special optical hardware at the optical system’s exit pupil, phase retrieval is an in situ, “image-based” method for determining the phase variations of light at the system’s exit pupil. Phase retrieval can be used both as an optical metrology tool (during fabrication of optical surfaces and assembly of optical systems) and as a sensor used in active, closed-loop control of an optical system, to optimize performance. One class of phase-retrieval algorithms is the iterative transform algorithm (ITA). ITAs estimate the phase variations by iteratively enforcing known constraints in the exit pupil and at the detector, determined from modeled or measured data.

The Variable Sampling Mapping (VSM) technique is a new method for enforcing these constraints in ITAs. VSM is an open framework for addressing a wide range of issues that have previously been considered detrimental to highaccuracy phase retrieval, including undersampled images, broadband illumination, images taken at or near best focus, chromatic aberrations, jitter or vibration of the optical system or detector, and dead or noisy detector pixels. The VSM is a model-to-data mapping procedure. In VSM, fully-sampled electric fields at multiple wavelengths are modeled inside the phase-retrieval algorithm, and then these fields are mapped to intensities on the light detector, using the properties of the detector and optical system, for comparison with measured data. Ultimately, this model-to-data mapping procedure enables a more robust and accurate way of incorporating the exitpupil and image detector constraints, which are fundamental to the general class of ITA phase retrieval algorithms.

This work was done by Jeffrey S. Smith, David L. Aronstein, Bruce H. Dean, and Richard G. Lyon of Goddard Space Flight Center. GSC-15693-1

This Brief includes a Technical Support Package (TSP).

Variable Sampling Mapping (reference GSC-15693-1) is currently available for download from the TSP library.

Please Login at the top of the page to download.