2012

Model-Based Method for Sensor Validation

Fault detection, diagnosis, and prognosis are essential tasks in the operation of autonomous spacecraft, instruments, and in situ platforms. One of NASA’s key mission requirements is robust state estimation. Sensing, using a wide range of sensors and sensor fusion approaches, plays a central role in robust state estimation, and there is a need to diagnose sensor failure as well as component failure. Sensor validation can be considered to be part of the larger effort of improving reliability and safety.

The standard methods for solving the sensor validation problem are based on probabilistic analysis of the system, from which the method based on Bayesian networks is most popular. Therefore, these methods can only predict the most probable faulty sensors, which are subject to the initial probabilities defined for the failures.

The method developed in this work is based on a model-based approach and provides the faulty sensors (if any), which can be logically inferred from the model of the system and the sensor readings (observations). The method is also more suitable for the systems when it is hard, or even impossible, to find the probability functions of the system. The method starts by a new mathematical description of the problem and develops a very efficient and systematic algorithm for its solution. The method builds on the concepts of analytical redundant relations (ARRs).

This work was done by Farrokh Vatan of Caltech for NASA’s Jet Propulsion Laboratory.

The software used in this innovation is available for commercial licensing. Please contact Daniel Broderick of the California Institute of Technology at This email address is being protected from spambots. You need JavaScript enabled to view it.. Refer to NPO-47574.

This Brief includes a Technical Support Package (TSP).

Model-Based Method for Sensor Validation (reference NPO-47574) is currently available for download from the TSP library.

Please Login at the top of the page to download.

White Papers

Evaluating the Chemistry of Brake Pads using SEM-EDS
Sponsored by Thermo Fisher
Optimizing Performance with Technology Embedded Apparel
Sponsored by Intercomp
Avoiding Common Mistakes in Extractables/Leachables Program Design
Sponsored by WuXi AppTec
Software Defined Radio Handbook
Sponsored by Pentek
Reducing Development Cycles for 3U VPX Systems
Sponsored by Curtiss-Wright Controls Embedded Computing
Thinking About Switching CAD Platforms? Check out this report.
Sponsored by CADD Edge

White Papers Sponsored By:

The U.S. Government does not endorse any commercial product, process, or activity identified on this web site.