Identification of Circuit Card Assembly Contamination Using NIR Spectroscopy
- Wednesday, 20 March 2013
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With the prevalence of circuit card assemblies (CCAs) and the array of components that could fail on any CCA, the ability to rapidly identify problems and take corrective measures is critical. NIR spectroscopy provides a useful technique for monitoring some failures that can occur in CCAs. A single NIR spectral fingerprint can be analyzed to provide detailed information about the sample. In this white paper, an NIR spectrometer determines the identity of a CCA contaminant that resulted in assembly failure.