Features

Vacuum Spectrometer

The Model 248/310 grazing incidence spectrometer from McPherson (Chelmsford, MA) makes direct optical measurements from one to 300 nanometers. The device enables testing of soft x-ray (XUV) high energy light sources (plasma or laser) and samples. Life time, persistence, or decay can be measured with continuous spectral scanning.

altA new “up” scanning feature combines the 789A-3 digital drive and 248/310 spectrometer system accessories. Soft- or hardware triggers coordinate data collection at specific wavelengths. Software, backed up by hardware, sets the wavelength scan region. An optional adjustable end switch system for the 248/310 is available. The vacuum spectrometers have focal lengths of 0.2 to two meters and more.

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