Asylum Research (Santa Barbara, CA) has announced the new NanoRack™ Sample Stretching Stage Accessory for its MFP-3D™ atomic force microscopes (AFMs). This high-strain, high-travel manual stretching stage provides two axis stress control of tensile loaded samples under different loads. Automatic load cell calibration provides integrated force measurements with MFP-3D images or other measurements, and returns both stress and strain data. Maximum sample load is 80N. The stage is compatible with a wide variety of AFM imaging techniques including Phase and Dual AC™ for enhanced contrast of material properties, as well as the MFP-3D’s Ztherm™ option for localized thermal analysis.