Techniques for Characterizing Microwave Printed Antennas
- Tuesday, 19 December 2006
Slot-line and other printed antennas can be characterized quickly and inexpensively.
The combination of a de-embedding technique and a direct on-substrate measurement technique has been devised to enable measurement of the electrical characteristics (impedances, scattering parameters, and gains) of microwave printed antennas that may be formed integrally with feed networks that include slot lines, coplanar striplines, and/or coplanar waveguides. The combination of techniques eliminates the need for custom test fixtures, including transitions between (1) coaxial or waveguide feed lines in typical test equipment and (2) the planar waveguide structures of the printed circuits under test. The combination of techniques can be expected to be especially useful for rapid, inexpensive, and accurate characterization of antennas for miniature wireless communication units that operate at frequencies from a few to tens of gigahertz.
The direct on-substrate measurement technique involves the calibration of the ground-signal microwave probes to their tips. This calibration is done by use of the ANA with an open circuit, a short circuit, and a matched load as standards. The standards for direct measurements are provided by the probe manufacturer on an impedance standard substrate. Calibrated probes are then put in contact with the input terminals of the slot-line feed of the antenna, and the antenna is excited via the probes. The direct on-substrate measurement technique is best suited for designs in which the slot-line feeds are short enough to interfere only minimally with the probes.
This work was done by Rainee Simons of NYMA/Federal Data Corp. and Richard Q. Lee of Glenn Research Center. For further information, access the Technical Support Package (TSP) free on-line at www.techbriefs.com/tsp under the Computers/Electronics category.
Inquiries concerning rights for the commercial use of this invention should be addressed to NASA Glenn Research Center, Commercial Technology Office, Attn: Steve Fedor, Mail Stop 4—8, 21000 Brookpark Road, Cleveland, Ohio 44135. Refer to LEW-17040.
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