Electrically Variable or Programmable Nonvolatile Capacitors
Marshall Space Flight Center
Thursday, October 01 2009
Capacitances are measured using small AC signals or changed using larger pulses.
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Electrically variable or programmable
capacitors based on the
unique properties of thin perovskite
films are undergoing development.
These capacitors show
promise of overcoming two important
deficiencies of prior electrically
programmable capacitors:
Unlike in the case of varactors, it
is not necessary to supply power
continuously to make these
capacitors retain their capacitance
values. Hence, these capacitors
may prove useful as components
of nonvolatile analog and
digital electronic memories.
Unlike in the case of ferroelectric
capacitors, it is possible to measure
the capacitance values of
these capacitors without changing
the values. In other words,
whereas readout of ferroelectric
capacitors is destructive, readout
of these capacitors can be nondestructive.
Figure 1. An Electrically Variable Capacitor of the type described in the text can be fabricated on a silicon or other substrate as part of an integrated circuit.
A capacitor of this type is a simple
two-terminal device. It includes a thin
film of a suitable perovskite as the
dielectric layer, sandwiched between
two metal or metal oxide electrodes
(for example, see Figure 1). The utility
of this device as a variable capacitor is
based on a phenomenon, known as
electrical-pulse-induced capacitance
(EPIC), that is observed in thin perovskite
films and especially in those
thin perovskite films that exhibit the
colossal magnetoresistive (CMR) effect.
In EPIC, the application of one or more
electrical pulses that exceed a threshold
magnitude (typically somewhat less
than 1 V) gives rise to a nonvolatile
change in capacitance. The change in
capacitance depends on the magnitude
duration, polarity, and number of pulses.
It is not necessary to apply a magnetic
field or to cool the device below (or
heat it above) room temperature to
obtain EPIC. Examples of suitable CMR
perovskites include Pr1–xCaxMnO3,
La1–xCaxMnO3, La1–xSrxMnO3, and
Nb1–xCaxMnO3.
Figure 2. The Capacitance of the Electrically Variable Capacitor is changed or measured, depending on the position of the switch and the nature of the applied signal.
Figure 2 is a block diagram showing
an EPIC capacitor connected to a circuit
that can vary the capacitance,
measure the capacitance, and/or
measure the resistance of the capacitor.
A pulse generator applies voltage
pulses to change the capacitance. If
desired, after each pulse, the capacitance
and resistance can be measured
by use of an inductance-capacitance-resistance
multimeter or an impedance/
gain analyzer. Also if desired, the
DC resistance can be measured by
applying a current of ≈1 μA and measuring
the resulting voltage drop
between the electrodes by use of a
high-internal-resistance voltmeter. The
magnitude of the AC test potential
applied by the multimeter or analyzer
and/or the magnitude of the DC test
potential is kept below 50 mV — well
below the threshold magnitude — so
as not to change the capacitance unintentionally.
The threshold potential depends on
a number of factors, including the composition
and thickness of the perovskite
film and the details of the process used
to fabricate the device. The change in
capacitance caused by a given pulse can
be wholly or partly reversed by reversing
the polarity of the pulse: that is, a
pulse with one polarity causes the
capacitance to decrease, and a pulse of
the opposite polarity causes the capacitance
to increase. The sign of the
change in capacitance in relation to
polarity of a pulse depends on the
aforementioned factors and on additional
factors, including the capacitance-
change history of the device, the
amplitude and duration of the pulse.
After each change, the capacitance
value is stable: It remains the same after
repeated measurements using a signal
much smaller than a capacitance-changing
pulse.
This work was done by Shangqing Liu,
NaiJuan Wu, Alex Ignatiev, and Jianren Li
of the University of Houston for Marshall
Space Flight Center. For more information,
contact Sammy Nabors, MSFC Com -
mercialization Assistance Lead, at
This e-mail address is being protected from spambots. You need JavaScript enabled to view it
. Refer to MFS-31960-1