| Property | Value |
| Name | Achieving Accurate and Reliable Resistance Measurements in Low Power and Low Voltage Applications |
| Description | Low voltage measurements are often associated with resistance measurements of highly conductive semiconductor materials and devices. These tests normally involve sourcing a known current, measuring the resulting voltage, and calculating the resistance using Ohm’s Law. Because of the DUT’s inherent low resistance, the resulting voltage will be very small and great care needs to be taken to reduce offset voltage and noise, which can normally be ignored when measuring higher signal levels. |
| Filename | keithley_wp_4_0508_delta_mode.pdf |
| Filesize | 301.24 kB |
| Filetype | pdf (Mime Type: application/pdf) |
| Creator | luke |
| Created On: | 06/02/2008 15:33 |
| Viewers | Everybody |
| Maintained by | Editor |
| Hits | 12 Hits |
| Last updated on | 09/09/2008 12:03 |
| Homepage | http://www.techbriefs.com/content/view/2902/119/ |
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