NASA Tech Briefs’ Materials Web page spotlights new engineering materials, coatings, and materials processing techniques, related primarily to ceramics, composites, plastics, and ferrous and non-ferrous metals, as published in NASA Tech Briefs magazine. The Tech Briefs describe applications of these materials in aerospace, defense, electronics, automotive, consumer products, and other major industries. Many of the Tech Briefs below are correlated to a Technical Support Package (TSP) or White Paper that can be downloaded free of charge.
Oct 2008
Advances In ULTRA-Accurate Temperature Measurement Design
Temperature is the world's most widely measured property. Most temperature measurement instruments deployed today rely on technology architectures developed when silicon-based devices were far more costly and DOS ran computers. New approaches to analog design have changed this paradigm. This paper describes how the latest techniques in analog technology can be applied to the development of ultra-accurate temperature measurement ...
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Aug 2008
Introduction to Laser Scanning - Video White PaperCutting Edge Technology Leads to Victory on the Road Course - Video White Paper
Large Part Inspection with the FARO Laser Tracker - Video White Paper
Expanding Quality With the Latest Generation of the FaroArm - Video White Paper
Jul 2008
Advanced RFID Measurements: Basic Theory to Protocol Conformance TestGPS Receiver Testing
Jun 2008
Everything You Ever Wanted to Know about Data Acquisition, Part One — Analog InputsNew Test Sequencing Instruments Lower Cost of Test for Device Manufacturers
Obtaining More Accurate Resistance Measurements Using the 6-Wire Ohms Measurement Technique
Improving the Repeatability of Ultra-High Resistance and Resistivity Measurements
Orthogonal Frequency Division Multiplexing
Improving Low Current Measurements on Nanoelectronic and Molecular Electronic Devices
Achieving Accurate and Reliable Resistance Measurements in Low Power and Low Voltage Applications
Mar 2008
FPGAs - Under the HoodApr 2007
Controlling Stand-Alone and Modular Instruments with NI LabVIEW SignalExpressWhat's New With CompactDAQ
Mar 2007
MicroTCA™ System ManagementAdvanced Signal Routing with the NI PXI-2593 and NI SCXI-1193 RF Switches
Using the NI 655x for Logic Analyzer Applications
Maximizing the Performance of the NI 6534 Digital I/O Device
Bandwidth, Sample Rate, and Nyquist Theorem
Benefits of Deep Memory in High-Speed Digitizers
Digital Multimeter Measurement Tutorial
Matrix Switch Expansion Guide
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