MEMs

Magnetic Testing Technique Helps Ensure Reliability of PV Cells

Making use of the force generated by magnetic repulsion, Georgia Tech researchers have developed a new technique for measuring the adhesion strength between thin films of materials used in microelectronic devices, photovoltaic cells, and microelectromechanical systems (MEMS).

Posted in: Solar Power, Renewable Energy, Test & Measurement, Semiconductors & ICs, MEMs, News

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