Photonics/Optics

Field Emission Scanning Electron Microscope

JEOL USA (Peabody, MA) has introduced a new entry-level, high-performance Field Emission Scanning Electron Microscope. The JSM- 7200F features ultrahigh spatial resolution of 1.6nm at 1.0kV and high probe current of 300nA. Featuring through-the-lens detectors that can collect a variety of signals by varying the built-in energy filter, the JSM-7200F produces a large amount of data in a very short amount of time.

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USB 3.0 Cameras

IDS Imaging Development Systems GmbH (Obersulm, Germany/Boston, MA) has released its USB 3 uEye CP series, featuring sensors from Aptina and e2v. The 5 MP Aptina sensors in the UI-3480CP Rev. 2 (monochrome) or UI-3580CP Rev. 2 (color) cameras are suitable for classical machine vision tasks as well as for microscopy and medical applications. Providing 60 fps, the e2v sensors in the UI-3240CP Rev. 2 (1.3 MP) or UI-3250CP Rev. 2 (2 MP) devices support machine vision, traffic monitoring, and quality assurance tasks. The 1.3 MP sensor from e2v is also available as an NIR version.

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High-Speed Cameras

The CB120, a 4K camera from XIMEA (Münster, Germany/Golden, CO), uses a PCI Express® (PCIe®) interface and delivers 12-Megapixel images. With the help of fiber-optic cable, 130 frames per second is achieved over distances up to 300 meters. The CB120 provides bandwidth of 20 Gb/s.

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Scientific CMOS Cameras

The Photometrics Prime scientific CMOS camera from Photometrics (Tucson, AZ) enables signal restoration and feature detection for localization-based Super Resolution Microscopy. The 4.2-Megapixel Prime features an FPGA-based Embedded Signal Processing engine, ESP™.

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CMOS Cameras

New ace models from Basler (Ahrensburg, Germany/Exton, PA) feature Sony's IMX249 global shutter CMOS sensor. The cameras deliver 40 frames per second at 2.3 megapixel resolution. Additionally, the models are available with both USB 3.0 and GigE interfaces.

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Open Source Software

Bitplane (Belfast, Northern Ireland) announced that its proprietary IMS file format would become Open Source. The IMS file format is based on Hierarchical Data Format (HDF5), which is designed to work with huge multidimensional data and is optimized to allow extremely fast visualization of huge volume data. To facilitate this, the format stores not only the original image data but also lower resolution versions of the original data. This allows the visualization software to load the resolutions which match those of the screen.

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Spectral Test Station

The McPherson (Chelmsford, MA) Spectral Test Station (STS) is for wavelength testing and calibration from LWIR to 200 nanometers and less. It is for sensor testing, process control, and calibration.

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