Semiconductors & ICs

G4-FETs as Universal and Programmable Logic Gates

Logic functions could be implemented using fewer active circuit elements. An analysis of a patented generic silicon-on-insulator (SOI) electronic device called a G4-FET has revealed that the device could be designed to function as a universal and programmable logic gate. The universality and programmability could be exploited to design logic circuits containing fewer discrete components than are required for conventional transistor-based circuits performing the same logic functions.

Posted in: Semiconductors & ICs, Briefs

Read More >>

Improved On-Chip Measurement of Delay in an FPGA or ASIC

Input and output buffers and the associated delays are eliminated. An improved design has been devised for on-chip-circuitry for measuring the delay through a chain of combinational logic elements in a field-programmable gate array (FPGA) or application-specific integrated circuit (ASIC). Heretofore, it has been the usual practice to use either of two other types of on-chip delay-measuring circuits: A delay chain of inverters is incorporated into the FPGA or ASIC chip along with an input port for feeding the inverter chain and an output port for feeding a signal to off-chip measurement circuitry. The disadvantage of this design is that the measurement is inaccurate because it includes delays in buffers that are parts of the input and output ports. The delay chain is arranged as a ring oscillator. The disadvantage of this design is that the delay chain does not always oscillate as expected.

Posted in: Semiconductors & ICs, Briefs

Read More >>

MMIC Amplifier Produces Gain of 10 dB at 235 GHz

This is the fastest MMIC amplifier reported to date. The first solid-state amplifier capable of producing gain at a frequency >215 GHz has been demonstrated. This amplifier is an intermediate product of a continuing effort to develop amplifiers having the frequency and gain characteristics needed for a forthcoming generation of remote-sensing instruments for detecting water vapor and possibly other atmospheric constituents. There are also other potential uses for such amplifiers in wide-band communications, automotive radar, and millimeter- wave imaging for inspecting contents of opaque containers.

Posted in: Semiconductors & ICs, Briefs

Read More >>

Integrated Radial Probe Transition From MMIC to Waveguide

Packaging based on wire bonding would be supplanted by monolithic integration. A radial probe transition between a monolithic microwave integrated circuit (MMIC) and a waveguide has been designed for operation at frequency of 340 GHz and to be fabricated as part of a monolithic unit that includes the MMIC. Integrated radial probe transitions like this one are expected to be essential components of future MMIC amplifiers operating at frequencies above 200 GHz. While MMIC amplifiers for this frequency range have not yet been widely used because they have only recently been developed, there are numerous potential applications for them — especially in scientific instruments, test equipment, radar, and millimeter- wave imaging systems for detecting hidden weapons.

Posted in: Semiconductors & ICs, Briefs

Read More >>

Programs for Testing Processor-in-Memory Computing Systems

The Multithreaded Microbenchmarks for Processor-InMemory (PIM) Compilers, Simulators, and Hardware are computer programs arranged in a series for use in testing the performances of PIM computing systems, including compilers, simulators, and hardware. The programs at the beginning of the series test basic functionality; the programs at subsequent positions in the series test increasingly complex functionality. The programs are intended to be used while designing a PIM system, and can be used to verify that compilers, simulators, and hardware work correctly. The programs can also be used to enable designers of these system components to examine tradeoffs in implementation. Finally, these programs can be run on non-PIM hardware (either singlethreaded or multithreaded) using the POSIX pthreads standard to verify that the benchmarks themselves operate correctly. (POSIX -Portable Operating System Interface for UNIX- is a set of standards that define how programs and operating systems interact with each other. pthreads is a library of pre-emptive thread routines that comply with one of the POSIX standards).

Posted in: Semiconductors & ICs, Briefs

Read More >>

PVM Enhancement for Beowulf Multiple-Processor Nodes

A recent version of the Parallel Virtual Machine (PVM) computer program has been enhanced to enable use of multiple processors in a single node of a Beowulf system (a cluster of personal computers that runs the Linux operating system). A previous version of PVM had been enhanced by addition of a software port, denoted BEOLIN, that enables the incorporation of a Beowulf system into a larger parallel processing system administered by PVM, as though the Beowulf system were a single computer in the larger system. BEOLIN spawns tasks on (that is, automatically assigns tasks to) individual nodes within the cluster. However, BEOLIN does not enable the use of multiple processors in a single node. The present enhancement adds support for a parameter in the PVM command line that enables the user to specify which Internet Protocol host address the code should use in communicating with other Beowulf nodes. This enhancement also provides for the case in which each node in a Beowulf system contains multiple processors. In this case, by making multiple references to a single node, the user can cause the software to spawn multiple tasks on the multiple processors in that node.

Posted in: Semiconductors & ICs, Briefs

Read More >>

Equipment for On-Wafer Testing From 220 to 325 GHz

On-wafer vector network analysis of semiconductors is extended to higher frequencies. A system of electronic instrumentation, constituting the equivalent of a two-port vector network analyzer, has been developed for use in on-wafer measurement of key electrical characteristics of semiconductor devices at frequencies from 220 to 325 GHz. A prior system designed according to similar principles was reported in “Equipment for On-Wafer Testing at Frequencies Up to 220 GHz” (NPO-20760), NASA Tech Briefs, Vol. 25, No. 11 (November 2001), page 42. As one would expect, a major source of difficulty in progressing to the present higherfrequency- range system was the need for greater mechanical precision as wavelengths shorten into the millimeter range, approaching the scale of mechanical tolerances of prior systems.

Posted in: Semiconductors & ICs, Briefs

Read More >>