Test & Measurement

Ground Bond Testers

Slaughter Company (Lake Forest, IL) announced the 260 Series Ground Bond testers with an improved interface that eliminates menus and redundant button pushes. The interface allows manufacturers to set up and run Ground Bond tests in seconds. The Model 264 is a 6-kV Hipot tester, and the Model 266 is a 5-kV Hipot tester. The testers provide security settings that enable quick setup of permission levels. With five programmable memories and a rugged design, the testers are suited for production line applications. Optional USB interface provides a way for manufacturers to automate a production line. For Free Info Visit http://info.hotims.com/61060-404

Posted in: Products, Manufacturing & Prototyping, Test & Measurement

Read More >>

Digital Multimeters

The U1280 and U1240C Series handheld digital multimeters from Keysight Technologies (Santa Rosa, CA) feature 60,000-count display resolution and 0.025 percent accuracy. The 4.5-digit handheld DMMs are suited for electronics manufacturing, installation, and maintenance work in the electronics test industry. The U1240C 4-digit DMMs come with 10,000-count display resolution and 0.09 percent accuracy, and provide a range of measurement functions. The U1240C comes with ZLOW and harmonic ratio. ZLOW provides low impedance mode to eliminate stray voltages. The harmonic ratio function gives an indication of the presence of harmonics. The DMMs are capable of withstanding up to a three-meter (ten-foot) drop. The U1240C is CAT IV 600 V and CAT III 1000 V compliant for electrical testing and measurement. Both series come with extended battery life — 800 hours for the U1280 Series and 400 hours for the U1240C. For Free Info Visit http://info.hotims.com/61060-402

Posted in: Products, Manufacturing & Prototyping, Test & Measurement

Read More >>

Multi-Function Instrument

National Instruments (Austin, TX) introduced a high-performance model of the software-based VirtualBench all-in-one instrument that combines a mixed-signal oscilloscope, function generator, digital multimeter, programmable DC power supply, and digital I/O. The new version offers 350 MHz of bandwidth, four analog channels, and Ethernet connectivity. The mixed-signal oscilloscope with protocol analysis delivers 350 MHz of bandwidth and four analog channels for higher-performance interactive test. The higher-wattage programmable DC power supply features up to 3 A for the 6 V output channel, and up to 1 A for the 25 V and -25 V channels for higher current applications. A unified view of all five instruments, visualization on larger displays, and functionality to save data and screenshots are provided. For Free Info Visit http://info.hotims.com/61060-403

Posted in: Products, Manufacturing & Prototyping, Test & Measurement

Read More >>

Strain Gauge Monitors

Bristol Instruments (Boston, MA) introduced the OM502T Series of monitors for strain gauge sensors. The 5-digit instruments are programmable for mathematical functions, including peak and tare, as well as digital filters. The monitors are available with 0.56- inch-tall red or green LED displays, depending on the model. Accuracy is to 0.05% of range, and rate is up to 100 measurements/sec. Up to four relay outputs are available, and can be turned on or off at preset load values. Analog outputs are 0 to 2/5/10 V, ±10 V; 0 to 5 mA; and 0/4 to 20 mA. Digital output interfaces include RS-232 and RS-485 — both isolated — with MODBUS and PROFIBUS protocols. The monitors offer fixed and adjustable excitation options. between 10 to 30 V AC/DC, 80 to 250 V AC/DC. For Free Info Visit http://info.hotims.com/61060-406

Posted in: Products, Manufacturing & Prototyping, Test & Measurement

Read More >>

Shaft Voltage Tester

The AEGIS® CAT II/III Shaft Voltage Tester™ digital oscilloscope from Electro Static Technology (Mechanic Falls, ME) enables testing of industrial motors controlled by variable frequency drives (VFDs). The tester is designed and configured to take and capture voltage measurements from the spinning shafts of motors. The digital oscilloscope comes with a conductive microfiber-tipped probe, a probe holder with magnetic base, and a carrying case. The 2-channel, full-function, 100-MHz oscilloscope has a 5.7" TFT LCD color display, a multi-language user interface, and a 5-hour rechargeable/replaceable lithium-ion battery pack. The oscilloscope is capable of sampling rates of 1 GSa/s to 50 GSa/s, and has a USB port for data transfer or flash drive storage.

Posted in: Products, Manufacturing & Prototyping, Test & Measurement

Read More >>

RF Signal Generators

Saelig Co. (Fairport, NY) announced Rigol DSG800 RF signal generators with output frequencies from 9 kHz to 3.0 GHz. They provide an RF signal source with a maximum output of +20 dBm and frequency resolution of 0.01 Hz at any frequency. Featuring SSB noise of -115 dBc/Hz, they feature a stable internal clock for creating RF test signals. The instruments provide conventional sweep functions (step, list, logarithmic, and linear) as well as analog modulation functions including amplitude modulation, frequency modulation, phase modulation, and pulse modulation. They also offer an optional pulse train generation capability for translating serial data onto an RF link without additional hardware. The pulse train can be used as the modulating signal of pulse modulation, and can also be output as an independent pulse generator.

Posted in: Products, Manufacturing & Prototyping, Test & Measurement

Read More >>

Advanced Capabilities of PXI-Based Semiconductor Test Systems

The ongoing challenge for today’s semiconductor test engineers is to identify and create new test solutions that can offer significantly lower test costs as well as address the need for configurable, open-architecture, flexible test solutions that can provide comparable features to proprietary ATE platforms. In particular, for test requirements with low to moderate volumes — such as pilot production, verification, and focused production test applications — the need for flexible and cost-effective ATE solutions is particularly acute. For these applications, test engineers historically have relied upon legacy test systems that have a low acquisition cost, but high operating costs or in-house designed rack-and-stack solutions. However, semiconductor test system solutions based on the PXI platform have made significant advancements in functionality and performance over the past three or four years, offering test engineers a viable alternative for both current and future test needs.

Posted in: Articles, Test & Measurement

Read More >>

White Papers

Energy Chain® Cable Carriers: The Right Material for Any Application
Sponsored by igus
Adhesion Reduction of Semiconductor Dicing Tape
Sponsored by Excelitas
The Best Springs You Haven't Tried Yet
Sponsored by Rotor Clip
Basics of Electric Heaters
Sponsored by Hotwatt
Protecting the Sky
Sponsored by Rohde and Schwarz AD
Comparison of Interface Pressure Measurement Options
Sponsored by Tekscan

White Papers Sponsored By:

The U.S. Government does not endorse any commercial product, process, or activity identified on this web site.