Test & Measurement

Dynamic Signal Analyzer

Data Translation (Marlboro, MA) announced the DT7837 ARM-based dynamic signal analyzer module for noise and vibration measurement. The computer portion of the module uses a ruggedized BeagleBone Black ARM processor. Complete source code is provided that can be modified and used without any restrictions. The front-end design allows simultaneous measurement of four 24-bit IEPE sensor inputs at a sampling rate of 102.4 kS/s. The module is used for precision measurements with microphones, accelerometers, and other transducers that have a large dynamic range. It also includes a 24-bit stimulus output, tachometer, general-purpose digital I/O, external trigger functions, and counter/timers. The ARM block processor includes BBB functions, FPGA, memory and support peripherals, interfaces for a USB host and client, Ethernet, power, and SD card.

Posted in: Products, Manufacturing & Prototyping, Test & Measurement

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Corrosion Detection

The ThermoCam LC (TCLC) from EVT Eye Vision Technology (Karlsruhe, Germany) detects surface defects such as cracks, pores, stripes, dents, and corrosion. The infrared camera detects corrosion that is invisible under the surface using the Impuls-Thermography method. The TCLC recognizes the defects as “hot spots.” A flash heats the surface, and the camera records the cooling of the material. Up to 100 images per second are delivered. The camera features noise (NETD) of 0.2 K, a measurement range from -50 to +300 °C, a field of view of 32 x 8 pixels, and opening angle of 40, 60, or 120°.

Posted in: Products, Manufacturing & Prototyping, Test & Measurement

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Voltage Meter

Dean Technology (Carrollton, TX) announced the HVM40B digital voltmeter for measurement of positive or negative voltages up to 40,000 Volts. It features an LED display, solid-state design, and dual-range measurement providing resolution below 20 kV. Other features include retractable feet, optional tilt handle, and optional rack-mount hardware. Input impedance of 10 giga-ohms minimizes circuit loading. It conforms to UL and CSA standards, and comes with various worldwide power cords.

Posted in: Products, Manufacturing & Prototyping, Test & Measurement

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Power Monitoring

Microchip Technology (Chandler, AZ) introduced the MCP39F511 single-phase power monitoring IC designed for real-time measurement of AC power. It is designed for use in high-performance commercial and industrial products such as lighting and heating systems, smart plugs, power meters, and AC/DC power supplies. To address industry requirements for better accuracy across current loads, additional power calculations, and event monitoring of various power conditions, the IC provides popular standard power calculations combined with advanced features. The import and export of active energy accumulation, four-quadrant reactive energy accumulation, zero-crossing detection, and dedicated PWM output have been integrated on-chip, along with the ability to measure active, reactive, and apparent power; RMS current and RMS voltage; line frequency; and power factor.

Posted in: Products, Manufacturing & Prototyping, Test & Measurement

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Accelerometers

PCB® Automotive Sensors Division (Depew, NY) offers MEMS DC response accelerometers for improving the precision of low-frequency vibration and motion in automotive applications. Available in full-scale ranges from ±2g to ±200g, the accelerometers come in single-axis (Series 3711E and Series 3741E) and triaxial (Series 3713E) configurations. The units include gas-damped, silicon MEMS sensing elements. Series 3711E and Series 3713E have a hermetically sealed titanium case, and Series 3741E units have a rugged anodized aluminum housing for harsh environments.

Posted in: Products, Manufacturing & Prototyping, Test & Measurement

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Every Measurement Starts with a Trigger

As today’s products in consumer electronics, automotive, and aerospace applications get more complex with every generation, the requirements on test instruments increase even more because test capabilities need to advance, while test times and time-to-market are expected to decrease. One important requirement for instruments like oscilloscopes is the ability to detect and trigger on an event of interest within a stream of unsuspicious signals fast and reliably. The quicker a specific event can be detected, the faster a problem in an electronic design can be debugged, reducing development and manufacturing test times.

Posted in: Articles, Test & Measurement

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Using Hardware Handshaking to Reduce ATE Test Times

Developing an automatic test equipment (ATE) system takes time, and there can be different approaches to achieve the same goal. Without the right approach, the system can become less efficient, contributing to more time spent or more resources used to complete the task. With advances in technology, ATE systems are becoming more widely used across a range of industries including manufacturing, avionics, aerospace, military, and defense. ATE systems are efficient and can be incredibly useful, allowing quick and accurate testing that communicates across a set of devices. However, it can become a complicated task to properly set up an ATE system to achieve the user’s desired outcomes.

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