Test & Measurement

Multi-Function Instrument

National Instruments (Austin, TX) introduced a high-performance model of the software-based VirtualBench all-in-one instrument that combines a mixed-signal oscilloscope, function generator, digital multimeter, programmable DC power supply, and digital I/O. The new version offers 350 MHz of bandwidth, four analog channels, and Ethernet connectivity. The mixed-signal oscilloscope with protocol analysis delivers 350 MHz of bandwidth and four analog channels for higher-performance interactive test. The higher-wattage programmable DC power supply features up to 3 A for the 6 V output channel, and up to 1 A for the 25 V and -25 V channels for higher current applications. A unified view of all five instruments, visualization on larger displays, and functionality to save data and screenshots are provided. For Free Info Visit http://info.hotims.com/61060-403

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Strain Gauge Monitors

Bristol Instruments (Boston, MA) introduced the OM502T Series of monitors for strain gauge sensors. The 5-digit instruments are programmable for mathematical functions, including peak and tare, as well as digital filters. The monitors are available with 0.56- inch-tall red or green LED displays, depending on the model. Accuracy is to 0.05% of range, and rate is up to 100 measurements/sec. Up to four relay outputs are available, and can be turned on or off at preset load values. Analog outputs are 0 to 2/5/10 V, ±10 V; 0 to 5 mA; and 0/4 to 20 mA. Digital output interfaces include RS-232 and RS-485 — both isolated — with MODBUS and PROFIBUS protocols. The monitors offer fixed and adjustable excitation options. between 10 to 30 V AC/DC, 80 to 250 V AC/DC. For Free Info Visit http://info.hotims.com/61060-406

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Shaft Voltage Tester

The AEGIS® CAT II/III Shaft Voltage Tester™ digital oscilloscope from Electro Static Technology (Mechanic Falls, ME) enables testing of industrial motors controlled by variable frequency drives (VFDs). The tester is designed and configured to take and capture voltage measurements from the spinning shafts of motors. The digital oscilloscope comes with a conductive microfiber-tipped probe, a probe holder with magnetic base, and a carrying case. The 2-channel, full-function, 100-MHz oscilloscope has a 5.7" TFT LCD color display, a multi-language user interface, and a 5-hour rechargeable/replaceable lithium-ion battery pack. The oscilloscope is capable of sampling rates of 1 GSa/s to 50 GSa/s, and has a USB port for data transfer or flash drive storage.

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RF Signal Generators

Saelig Co. (Fairport, NY) announced Rigol DSG800 RF signal generators with output frequencies from 9 kHz to 3.0 GHz. They provide an RF signal source with a maximum output of +20 dBm and frequency resolution of 0.01 Hz at any frequency. Featuring SSB noise of -115 dBc/Hz, they feature a stable internal clock for creating RF test signals. The instruments provide conventional sweep functions (step, list, logarithmic, and linear) as well as analog modulation functions including amplitude modulation, frequency modulation, phase modulation, and pulse modulation. They also offer an optional pulse train generation capability for translating serial data onto an RF link without additional hardware. The pulse train can be used as the modulating signal of pulse modulation, and can also be output as an independent pulse generator.

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Advanced Capabilities of PXI-Based Semiconductor Test Systems

The ongoing challenge for today’s semiconductor test engineers is to identify and create new test solutions that can offer significantly lower test costs as well as address the need for configurable, open-architecture, flexible test solutions that can provide comparable features to proprietary ATE platforms. In particular, for test requirements with low to moderate volumes — such as pilot production, verification, and focused production test applications — the need for flexible and cost-effective ATE solutions is particularly acute. For these applications, test engineers historically have relied upon legacy test systems that have a low acquisition cost, but high operating costs or in-house designed rack-and-stack solutions. However, semiconductor test system solutions based on the PXI platform have made significant advancements in functionality and performance over the past three or four years, offering test engineers a viable alternative for both current and future test needs.

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Calibration Requirements for Testing Coupling-Decoupling Networks

Coupling-Decoupling Networks (CDNs) are the unglamorous workhorses that get “hitched up” to an impulse generator in order to perform impulse testing on powered equipment. As such, performance and calibration requirements for CDNs have not been specified to the same level of detail as the impulse generator. This is no longer the case with the Third Edition of IEC 61000-4-5, the international standard for surge immunity testing.

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NASA Monitoring Technologies Shake Up Earthquake Prediction

The seconds to minutes of advance warning of an earthquake can allow people and systems to take actions to protect life and property from destructive shaking. Earthquake early warning systems use earthquake science and the technology of monitoring systems to alert devices and people when shaking waves generated by an earthquake are expected to arrive at their location. NASA has been one of the agencies at the forefront of earthquake early warning technology for many years, and new monitoring techniques developed by NASA are shaking up the way earthquakes are predicted.

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