Test & Measurement

Coming to a Lab Bench Near You: Femtosecond X-Ray Spectroscopy

Upon light activation (in purple, bottom row’s ball-and-stick diagram), the cyclic structure of the 1,3-cyclohexadiene molecule rapidly unravels into a near-linear shape in just 200 femtoseconds. Using ultrafast X-ray spectroscopy, researchers have captured in real time the accompanying transformation of the molecule’s outer electron “clouds” (in yellow and teal, top row’s sphere diagram) as the structure unfurls. (Credit: Kristina Chang/Berkeley Lab)

The ephemeral electron movements in a transient state of a reaction important in biochemical and optoelectronic processes have been captured and, for the first time, directly characterized using ultrafast X-ray spectroscopy at the Department of Energy’s Lawrence Berkeley National Laboratory (Berkeley Lab). Like many rearrangements of molecular structures, the ring-opening reactions in this study occur on timescales of hundreds of femtoseconds (1 femtosecond equals a millionth of a billionth of a second). The researchers were able to collect snapshots of the electronic structure during the reaction by using femtosecond pulses of X-ray light on a tabletop apparatus.

Posted in: News, Lasers & Laser Systems, Optics, Photonics, Measuring Instruments, Test & Measurement
Read More >>

Infrared 3D Scanner Measures Like Human Vision

With the new infrared 3D scanner, people can be measured without disturbing projections. (© Photo Fraunhofer IOF)

A 3D scanner, with a resolution of one million pixels and real-time data processing, operates using measuring technology that works in a similar way to human vision. To detect an object, periodic patterns are projected onto the surface using a specially developed near-infrared projector. A sequence of different patterns is projected in rapid succession in order to record as many measurement points as possible by the two cameras.

Posted in: News, Measuring Instruments, Test & Measurement
Read More >>

Architectures for Implementing a Hardware-in-the-Loop System

Safety, availability, or cost considerations can make it impractical to perform all the necessary tests with the complete embedded control system. Using hardware-in-the-loop (HIL) simulation, you can simulate the parts of the system that pose these challenges. By thoroughly testing the embedded control device in a virtual environment before proceeding to real-world tests of the complete system, you can maintain reliability and time-to-market requirements in a cost-effective manner even as the systems you are testing become more complex. Download this whitepaper to find out more about implement a HIL system into your test environment.

Posted in: White Papers, Automotive, Electronics & Computers, Test & Measurement
Read More >>

Fabrication of Freeform Optics

Freeform surfaces on optical components have become an important design tool for optical designers. Non-rotationally symmetric optical surfaces have made solving complex optical problems easier. The manufacturing and testing of these surfaces has been the technical hurdle in freeform optic’s wide-spread use. Computer Numerically Controlled (CNC) optics manufacturing technology has made the fabrication of optical components more deterministic and streamlined for traditional optics and aspheres. Optimax has developed a robust freeform optical fabrication CNC process that includes generation, high speed VIBE polishing, sub-aperture figure correction, surface smoothing and testing of freeform surfaces. Metrology of freeform surface is currently achieved with coordinate measurement machines (CMM) for lower resolution and interferometry with computer generated holograms (CGH) for high resolution irregularity measurements.

Posted in: White Papers, Imaging, Optics, Photonics, Test & Measurement
Read More >>

Six Axes of Calibration

In a system or on a lab bench, proper instrument calibration reduces the chances of false test results. Not all calibrations are equal, and six key factors affect quality, usefulness and cost. In Six Axes of Calibration, we highlight the importance and value of each factor. Download application note.

Posted in: White Papers, RF & Microwave Electronics, Instrumentation, Test & Measurement
Read More >>

Low Cost Doesn't Have to be Low Quality

Keysight's new InfiniiVision 1000 X-Series oscilloscopes feature 50- to 100-MHz models with up to 6-in-1 instrument integration and industry-leading software analysis. They have the unbelievably low starting price of $449* and deliver professional-level functionality you'd expect from oscilloscopes 3x's the cost.

Posted in: White Papers, RF & Microwave Electronics, Instrumentation, Test & Measurement
Read More >>

The Perfect Balance of Price and High Quality

Your search for a low-cost, high-quality oscilloscope is over! Keysight's new InfiniiVision 1000 X-Series oscilloscopes feature industry-proven technology at the ultralow starting price of $449*. They have 50- to 100-MHz models and deliver industry-leading software analysis with 6-in-1 instrument integration.

Posted in: White Papers, Software, Test & Measurement
Read More >>

Low-Cost Device uses Light to Detect Oil Spills

Researchers have developed a simple device that can detect an oil spill in water and then pinpoint the type of oil present on the surface. The device is designed to float on the water, where it could remotely monitor a small area susceptible to pollution or track the evolution of contamination at a particular location.

Posted in: News, Test & Measurement
Read More >>

Pressure Mapping as a Research & Development Tool

Discover how pressure mapping technology can help drive ROI in your R&D process. The R&D process often involves making significant investments on test & measurement technology, like pressure mapping, to discover new opportunities for advancement. This new eBook explains how pressure mapping can be used to capture actionable interface pressure data in a variety of R&D applications.

Posted in: White Papers, White Papers, Sensors, Test & Measurement
Read More >>

Complete Guide to Building a Measurement System

You can choose from many different sensors on the market today to measure all types of natural phenomena. This white paper categorizes and compares the most common sensors for measuring seven of these phenomena to help you choose the best option for your application.

Posted in: White Papers, Electronics & Computers, Data Acquisition, Sensors, Test & Measurement
Read More >>

The U.S. Government does not endorse any commercial product, process, or activity identified on this web site.