Test & Measurement

Implementation of Real-time Spectrum Analysis

The keys to real-time spectrum analysis are to provide parallel sampling and FFT calculations so the data acquisition continues while the FFT’s are performed, and to provide fast enough DSP processing of FFT algorithms to keep up with the sample rate at the input. This white paper discusses the technical implementation of the real-time process in the Rohde & Schwarz real-time analyzers, and the applications for use of this analysis capability in the troubleshooting and test of modern designs.

Posted in: Test & Measurement, White Papers

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Oscilloscope Fundamentals

The oscilloscope is arguably one of the most useful tools ever created for use by electronic engineers. In the more than five decades since the modern analog oscilloscope was created, hundreds of useful documents and thousands of articles have been written about what it is, how it works, how to use it, and application-specific examples of the “oscilloscope” in action. It is the purpose of this primer to instead describe digital oscilloscopes, which have for practical purposes replaced their analog predecessors in the vast majority of applications. Covered here is a short description of the oscilloscope’s origins, its transition from analog to digital, types of digital oscilloscopes and their major subsystems, key benchmark specifications, and measurements.

Posted in: Test & Measurement, White Papers

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Troubleshooting EMI in Embedded Designs

Today, engineers need reliable data fast, and to ensure compliance with regulations for electromagnetic compatibility in the most economical way, appropriate measures must be taken early in the design phase. This paper provides a brief introduction to embedded EMI troubleshooting challenges and how to use a digital oscilloscope to debug the two key culprits of EMI – switching power supplies and power amplifiers. The Rohde & Schwarz R&S®RTO series oscilloscope provides time correlated multi-domain analysis often required to troubleshoot the complex time and frequency domain embedded design challenges.

Posted in: Test & Measurement, White Papers

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