Test & Measurement

Goddard Mission Services Evolution Center Compliance Test Suite

Goddard Space Flight Center, Greenbelt, Maryland To reduce the cost of building specialized interfaces, missions can adopt Goddard Mission Services Evolution Center (GMSEC) technologies and applications. Assurances need to be made that application implementation should follow the GMSEC messaging standards. The GMSEC Interface Specification Document (ISD) sets forth definitions for all GMSEC message types.

Posted in: Test & Measurement, Software, Briefs, TSP


Application of a Physics-Based Stabilization Criterion to Flight System Thermal Testing

Goddard Space Flight Center, Greenbelt, Maryland This innovation consists of a procedure and set of equations that allows thermal balance steady-state temperatures to be predicted hours before the balance is reached based on current temperature and rate-of-change measurements. This will allow tests to run faster, since thermal plateau settings may be adjusted prior to reaching an equilibrium state. Additionally, it will allow the test conductors to identify future limit violations hours before they may happen, which would increase flight hardware safety. A similar methodology can be used to predict component temperatures in flight, assuming a relatively constant sink temperature condition, which would be useful for long cool-down missions such as the James Webb Space Telescope (JWST).

Posted in: Test & Measurement, Briefs, TSP


Trajectory Specification for High-Capacity Air Traffic Control

Automating separation monitoring and guidance would relieve human controllers of the primary responsibility for safe separation. The doubling or tripling of airspace capacity that will be needed over the next several decades will require that tactical separation guidance be automated for appropriately equipped aircraft in high-density airspace. Four-dimensional (4D) trajectory assignment (three-dimensional position as a function of time) will facilitate such automation. A standard trajectory specification format based on XML (Extensible Markup Language) is proposed for that purpose.

Posted in: Electronics & Computers, Test & Measurement, Briefs, TSP


Big Ideas for Small Spaces

Over 24 hours from April 4 to 5, six top French design studios conceived and presented new product concepts for urban environments during the Small Spaces Design Hackathon, presented by Cut&Paste in partnership with Hewlett-Packard. In dense city neighborhoods, homes are small and office space is at a premium, so urban dwellers must be more creative in how they use their space. The design concepts were presented at Cyclone Le Studio as part of ZED, HP’s creative popup space.

Posted in: Electronics & Computers, Power Management, PCs/Portable Computers, Imaging, Displays/Monitors/HMIs, Software, Computer-Aided Design (CAD), Computer-Aided Engineering (CAE), Computer-Aided Manufacturing (CAM), Energy, Lighting, Test & Measurement, Monitoring, News


Optical Inspection System Finds Defects in Ultra-High-Speed Manufacturing

Researchers at the Fraunhofer Institute for Physical Measurement Techniques IPM in Germany have developed an optical inspection system called WIRE-AOI that can detect defects in strip products such as pipes, rails, and wires in real time. The system detects micro-defects that zoom past it at 10 meters per second, and are no thicker than a human hair. Workers then see the processed defects depicted graphically on a monitor, and can remove the corresponding pieces.

Posted in: Cameras, Imaging, Photonics, Optics, Test & Measurement, Measuring Instruments, News


"Improving Throughput with your Power Supply" compendium of Hints 1-10

This application compendium consists of 10 Hints on how to improve throughput with your power supply.

Posted in: Test & Measurement, White Papers


Conquering the Multi Kilowatt Source/Sink Test Challenge

When testing power storage devices such as batteries, battery management systems, bi-directional DC to DC converters, you need a solution that can both source and sink power. But when working at kilowatt and greater power levels this is a formidable challenge for test engineers. This application note looks at methods for addressing this test challenge and discusses their tradeoffs.

Posted in: Test & Measurement, White Papers


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