Subscribe

A Computing Platform Based on 4th Generation Intel® Core™ Processors That Provides Flexible and Expandable I/Os for In Vitro Diagnostics Instruments

Please Login at the top
of the page to download.

In the medical world, In Vitro Diagnostic (IVD) instruments are ubiquitously used in hospital labs, doctor offices, and at home. IVD instruments are designed for various qualitative or quantitative diagnostic procedures, commonly called assays, in assessing or measuring the target entity out of the samples. For different assays, IVD instruments are designed with the goal to automate the process, combining and streamlining labor-intensive steps. Based on their applications, these steps could be combined in one self-contained platform, in several discrete platforms, or a combination of both, depending on the application’s needs. Furthermore, some platforms use modularization, starting with minimum modules and then adding modules as the needs grow. This enables laboratories to pick and choose optional modules as needed. With modular design in mind, most IVD instrument providers start with a small footprint platform, and enhance the design with an expandability mechanism to accommodate more modules for future product enhancements. In order to be most effective, an embedded computing platform used in an IVD instrument needs to be easy-to-configure and easy-to-expand.

WADE-8015 Mini-ITX is one of the latest Portwell’s embedded computing solutions. This embedded system board is based on the latest 4th generation Intel® Core™ processors (codenamed Haswell), and features a PCIe x2 gold finger side-edge connector. The WADE-8015 provides power saving, greater performance, better visual experience, as well as enhanced security, and is easy to use, configure and expand for the development of IVD instrument.

White Papers

Putting FPGAs to Work in Software Radio Systems
Sponsored by Pentek
Designing Ring Projections for Hermetic Sealing
Sponsored by Miyachi Unitek
High-Speed A/Ds for Real-Time Systems
Sponsored by Pentek
PICO Brochure
Sponsored by Nordson EFD
Optimizing an Electromechanical Device with Multidimensional Analysis Software
Sponsored by Integrated Engineering Software
Reliability Testing of GORE® Protective Vents in LED Luminaires
Sponsored by Gore

White Papers Sponsored By: