Test & Measurement

Product of the Month: July 2017

Tektronix, Beaverton, OR, introduced the TTR500 Series USB vector network analyzer, a USB-based RF test instrument. It includes VectorVu-PC analysis software and built-in bias tee for testing active devices. The 2-port, 2-path S-parameter VNA features 100 kHz to 6 GHz frequency range, 122 dB dynamic range, less than 0.008 dB trace noise, and -50 to +7 dBm output power. The built-in bias tee allows for 0 to ± 24V, and 0 to 200 mA on both ports for active devices. The analyzer operates with any Windows PC or laptop, and VectorVu-PC software controls and calibrates the instrument. For automated test systems in design or manufacturing, the software offers programmatic support for SCPI commands, including command compatibility with common legacy VNAs for integration into existing test systems. In addition, the software offers an offline mode for data analysis with an output file format compatible with common EDA simulation tools. Accessories include a rugged carrying case, rack mount kits, phase-stable cables, attenuators, adapters, and calibration kits.

Posted in: Products, Instrumentation, Measuring Instruments, Monitoring, Test & Measurement

Product of the Month: April 2017

Astronics Test Systems, Irvine, CA, has introduced the PXIe-1802 arbitrary waveform generator and the PXIe-1803 digitizer that provide test capabilities and measurement accuracy in a compact PXI form factor for aerospace, defense, communications, and other high-reliability applications. The arbitrary waveform generator offers both speed and performance for output frequencies of up to 125 MHz. With built-in waveforms, high signal quality, and high density and modularity, the instrument delivers dual 14/16-bit waveform generator channels, bandwidths of 90-140 MHz, synchronization, and 250 μV measurement accuracy. The 130/180 MS/s dual-channel digitizer provides speed and performance for input frequencies up to 175 MHz. The dual-channel 14/16-bit digitizer is configurable as separate or fully synchronized channels. Other features include waveform bandwidths of 65-175 MHz (typical), 64M of waveform memory per channel, and relative accuracy of up to 0.006%.

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Posted in: Products, Measuring Instruments, Monitoring, Test & Measurement

Optical Device Tester

Anritsu Company (Richardson, TX) has introduced the BERTWave MP2110A, an all-in-one instrument that conducts simultaneous BER measurements and eye pattern analysis to more efficiently evaluate multi-channel optical devices used in optical communications systems, including 100GbE, InfiniBand EDR, and 32G Fibre Channel. The BERTWave MP2110A features a built-in BERT that can be configured with up to 4 channels at up to 28.2 Gbit/s, and up to a 2-channel sampling oscilloscope. This single-instrument design allows the BERTWave MP2110A to conduct simultaneous TRx BER measurements of multi-channel optical modules used by 100GbE standards, such as QSFP28, and other standards, such as InfiniBand EDR and 32G Fibre Channel, as well as simultaneous 2-channel eye pattern analyses.

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Posted in: Products, Products, Data Acquisition, Instrumentation, Measuring Instruments

Time-to-Digital Converter

Mouser Electronics, Inc., (Mansfield, TX) is now stocking the TDC7201 time-to-digital converter from Texas Instruments (TI). The TDC7201 is designed for use with ultrasonic, laser, and radar range finding equipment using time-of-flight (TOF) technique. TI’s TDC7201 time-to-digital converter has two built-in time-to-digital converters (TDCs) that can be used to measure distance down to 4 cm and up to several kilometers using a simple architecture. The TDC7201 features a wide measurement range of 0.25 ns to 8 ms and high accuracy of 28 ps. The device has a single shot resolution of 55 ps, (equivalent to 0.825 cm).

Posted in: Products, Products, Data Acquisition, Measuring Instruments

Single Photon Counting Module

Excelitas Technologies® (Waltham, MA) has introduced SPCM-NIR, a Single Photon Counting Module specifically selected and performance-optimized for the near-infrared (NIR) wavelength spectrum. This NIR-spectrum enhanced device is designed to support long-range LIDAR, quantum communication and microscopy applications. The Excelitas SPCM-NIR uses a specially selected silicon avalanche photodiode (SLiK) with peak single photon detection efficiency (PDE) at 780nm, typically better than 73%, while maintaining uniformity over a 180 μm diameter active area.

Posted in: Products, Products, Data Acquisition, Measuring Instruments

Diffuse Reflectance Probe

The Ocean Optics (Dunedin, FL) Diffuse Reflectance Probe (DR-Probe) measures 45° diffuse reflectance, enhancing UV-Vis and NIR spectroscopy results. The DR-Probe integrates a light source and collection optics into one unit. With the probe’s collection optics fixed in place relative to the light source, the measurement geometry is constant. An included standoff accessory ensures a consistent 40 mm focal length between the probe and the sample. The DR-Probe has rugged, all-metal construction for durability, and its 6W tungsten halogen bulb has a 10,000-hour lifetime.

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Posted in: Products, Optics, Photonics, Instrumentation

Products of Tomorrow: November 2016

The technologies NASA develops don’t just blast off into space. They also improve our lives here on Earth. Life-saving search-and-rescue tools, implantable medical devices, advances in commercial aircraft safety, increased accuracy in weather forecasting, and the miniature cameras in our cellphones are just some of the examples of NASA-developed technology used in products today.

Posted in: Products, Solar Power, Manufacturing & Prototyping, Sensors, Test & Measurement

Temperature Monitors

Measurement Computing, Norton, MA, offers the TC-32 and TC-32- EXP temperature monitors for thermocouple (TC) measurement. Providing both Ethernet and USB ports, the TC- 32 provides 32 channels of 24-bit resolution for medium channel installations, and the TC-32-EXP adds 32 high-precision channels to support larger installations. They feature sigma-delta 24-bit ADCs, differential inputs, TC-to-host isolation, and cold-junction compensation (CJC) for each channel.

Posted in: Products, Manufacturing & Prototyping, Monitoring, Test & Measurement


Teledyne LeCroy, Chestnut Ridge, NY, introduced HDO9000 high-definition oscilloscopes with HD1024 high-definition technology. Features include OneTouch user interface, 15.4" capacitive touchscreen, 10- bit resolution, bandwidths of 1 GHz to 4 GHz, and sample rates of 40 GS/s. Users can perform all common operations with a touch of the display.

Posted in: Products, Manufacturing & Prototyping, Test & Measurement

Semiconductor Test System

Marvin Test Solutions, Irvine, CA, released the TS-960e PXI Express semiconductor test platform that features test capabilities for RF devices and SoC applications. It features 256 125-MHz digital I/O channels with per-pin-PMU, and multiple RF and analog test instruments in a single, 21-slot PXIe chassis. It incorporates the GX5296 digital subsystem, software test suite, and RF instrumentation option.

Posted in: Products, Manufacturing & Prototyping, Semiconductors & ICs, Test & Measurement

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