Saki Corporation (San Jose, CA) has debuted its 3rd-generation 3D automated optical inspection (AOI) line that accommodates dual lanes, XXL sizes, and increases throughput by 15%. Saki’s new BF- 3Di-D (dual lane) and BF-3Di-Z (extra-large platform) 3D AOI equipment provides measurements of components with a height range between 0 and 20 mm, achieving 1-micron height resolution, a false call rate of less than 100 ppm with 0 escapes, and an increased positioning speed of 50%. The new camera and lighting systems capture extremely clear, detailed images with no shadowing for inspection of the most difficult defects, such as lifted leads, tombstones, reverses, and height variations.

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Photonics & Imaging Technology Magazine

This article first appeared in the March, 2016 issue of Photonics & Imaging Technology Magazine (Vol. 40 No. 3).

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