As the automotive industry rapidly evolves through electrification, connectivity, and autonomy, test equipment makers and test engineers are facing more challenges driven by a surge in systems functionality and complexity. Additionally, emerging and evolving standards require test instruments to be flexible and future-proof. The testing of inverters, electric motors, on-board chargers, and battery systems demands precision measurement and control of the high voltages and high currents. Dynamic power supplies, hardware-in-the-loop (HIL) simulators, and many other instruments are required to enable tests of these drivetrain components.
This 30-minute Webinar outlines the toughest automotive test challenges and provides several solutions designed to validate the next breakthroughs and drive forward innovation by ensuring the device under test meets or exceeds all performance requirements, adheres to safety certifications, and successfully passes software regression testing, among other benchmarks.
Attendees will:
- Learn how mega trends in the rapidly growing automotive industry drive safety and performance requirements that shape the automotive testing ecosystem
- Discover best-in-class solutions designed for testing high-voltage vehicle systems including dynamic power supplies, electronic loads, and battery cyclers
- Explore low-latency precision signal chains that enable HIL techniques for testing complex, real-time systems
A Q&A session will follow the technical presentation.
Speaker:
David Rowe, Marketing Director, Electronic Test & Measurement, Analog Devices
As Marketing Director for Electronic Test & Measurement, David Rowe works with customers and partners to leverage Analog Devices' technology to develop high-performance test and measurement solutions. He has been with the company for 23 years in various roles, including product/test engineering, applications, and marketing, across a range of analog and mixed-signal technologies. David holds a bachelor’s and master’s degree in electrical engineering from Boston University and the Massachusetts Institute of Technology, respectively.
Moderator:
Amanda Hosey, Editor, SAE Media Group
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