Baumer (Southington, CT) has introduced its HXC20NIR and HXC40NIR CMOS cameras, which measure electroluminescence in the near-infrared (NIR) light spectrum. Compared with monochrome technology, the cameras are twice as sensitive at a wavelength of 900 nanometers, using electroluminescence to effectively detect fractures and failures in the crystal structure of a solar wafer.
The HXC40NIR camera offers a resolution of four megapixels (2048 x 2048) with a 1:1 (2048 x 2048) aspect ratio. A global shutter sensor from CMOSIS features correlated double sampling (CDS). The HXC20NIR offers a resolution of 2048 x 1018 megapixels.
Both cameras support several image formats with up to 12 bits per pixel, and are equipped with a CameraLink® interface that permits high frame rates in both base (3 taps) and full (10 taps) modes.
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