The Model 248/310 grazing incidence spectrometer from McPherson (Chelmsford, MA) makes direct optical measurements from one to 300 nanometers. The device enables testing of soft x-ray (XUV) high energy light sources (plasma or laser) and samples. Life time, persistence, or decay can be measured with continuous spectral scanning.
A new “up” scanning feature combines the 789A-3 digital drive and 248/310 spectrometer system accessories. Soft- or hardware triggers coordinate data collection at specific wavelengths. Software, backed up by hardware, sets the wavelength scan region. An optional adjustable end switch system for the 248/310 is available. The vacuum spectrometers have focal lengths of 0.2 to two meters and more.
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