National Instruments, Austin, TX, has released the PXI-based Wireless Test System (WTS) that combines a PXI vector signal transceiver (VST) and multicore processing technologies to offer a single platform for multi-standard, multi-DUT, and multi-port testing. When used with test sequencing software, such as the TestStand Wireless Test Module, manufacturers can test multiple devices in parallel. Fullduplex RF ports and wideband RF instrumentation support current and future wireless standards such as LTE-A to 802.11ac and Bluetooth LE. The SCPI interface allows remote automation over Ethernet and smooth integration into existing manufacturing lines. Other features include up to 200-MHz instantaneous bandwidth, 65-MHz to 6-GHz frequency range, and SCPI interface via Ethernet.

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NASA Tech Briefs Magazine

This article first appeared in the October, 2015 issue of NASA Tech Briefs Magazine.

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