JEOL USA (Peabody, MA) has introduced a new entry-level, high-performance Field Emission Scanning Electron Microscope. The JSM- 7200F features ultrahigh spatial resolution of 1.6nm at 1.0kV and high probe current of 300nA. Featuring through-the-lens detectors that can collect a variety of signals by varying the built-in energy filter, the JSM-7200F produces a large amount of data in a very short amount of time.

For the fast-paced manufacturing environment, the JSM-7200F is a high-throughput easy-to-use FE SEM. For the research environment, it offers the analyst a wide variety of contrast mechanisms. Seamless observation and analysis using EDS, WDS, EBSD, STEM, BSE, and CL can be conducted easily and efficiently.

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NASA Tech Briefs Magazine

This article first appeared in the January, 2016 issue of NASA Tech Briefs Magazine.

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