The McPherson (Chelmsford, MA) Spectral Test Station (STS) is for wavelength testing and calibration from LWIR to 200 nanometers and less. It is for sensor testing, process control, and calibration.

CCD, CMOS, InGaAs, and further to the infrared, each exhibit a unique response. The spectral test station delivers discreet, high-purity wavelength bands to devices under test to help characterize their response to specific wavelengths of light in order to calibrate their response. The STS enables spectral test and characterization of various and diverse sensor and seeker formats including high-tech imaging, hyperspectral, and electro-optical tracking sensors. The STS uses a research-grade McPherson spectrometer that brings intrinsic features. Collimators with a variety of beam diameters to match your sensor format are available.

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NASA Tech Briefs Magazine

This article first appeared in the January, 2016 issue of NASA Tech Briefs Magazine.

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