Machine Vision Cameras

Teledyne DALSA (Waterloo, Canada) announced its new Falcon4-CLHS M4480 and M4400 cameras, based on the Teledyne e2v Lince 11.2M monochrome sensors. The new Falcon4-CLHS interface cameras have been specifically engineered for industrial imaging applications requiring high-speed data transfer. These models can reach multiple thousands of frames per second in partial scan mode, and when using the sensor’s binning mode, can reach a very large pixel full well capacity of over 160Ke. The Falcon4-CLHS leverages standard cabling technology such as CX4 and fiber optic (AOC) cables to maximize length and speed.

Click here to learn more. 


Microspectrophotometer

CRAIC Technologies (San Dimas, CA) has introduced the 20/30 XL™ UV-visible-NIR microspectrophotometer. The 20/30 XL™ microspectrophotometer is designed to non-destructively analyze microscopic features of very large flat panel displays by incorporating large scale sample handling. The 20/30 XL™ microspectrophotometer integrates an advanced CRAIC Technologies Lightblades™ spectrophotometer with a sophisticated UV-visible-NIR range microscope optics and powerful, easy-to-use Lambdafire™ software.

Click here to learn more. 


IR Laser Glass Cutting Module

Holo/Or (Ness Ziona, Israel) introduced its new DeepCleave™ module for ultra-short pulse IR laser glass cutting equipment. DeapCleave™ transforms a Gaussian laser beam into constant peak power along the entire depth of focus, optimized to increase throughput by preventing energy waste below the process threshold and enabling full-depth glass cutting from a single pulse. DeepCleave™ is designed to easily integrate with any existing opto-mechanics. The module is designed for the IR wavelength range, but can be customized to any desired wavelength and has shown success in microscopy applications as well, with 532nm wavelength.

Click here to learn more. 


LED Pattern Projector

Innovations in Optics, Inc. (Woburn, MA) introduced the Pattern Blazer™, a high-power, LED fixed-pattern projector for structured lighting and stereovision in 3D machine vision. Pattern Blazer™ applications include determination of object shape and orientation, contour mapping of parts, surface defect detection, depth measurements, guidelines, edge detection, and alignment. A near infrared version is suited for video identification in long-range CCTV security and surveillance. The Pattern Blazer features four standard LED spectral options, blue (480 nm), red (660 nm) near-infrared (860 nm), and broadband white (4800K).

Click here to learn more. 


DROIC Quarter Wafers

Senseeker Engineering (Santa Barbara, CA) has made it easier to procure state-of-the-art digital readout ICs by introducing sales of quarter wafers of the Oxygen® RD0092 digital readout IC (DROIC). A full data pack that includes a GUI-based clickable wafer map is also furnished. The wafer map provides color-coded grade information for each die along with a top-level summary (die yield, results of each individual test, and final grade). Clicking any die on the map displays a detailed test summary plot that contains test images, histograms for the test images, pixelwise differences used to reject bad pixels with pass/fail thresholds indicated, bad pixel map image and a bar graph showing the measured supply currents in the screen test state.

Click here to learn more.