Marvin Test Solutions, Irvine, CA, released the TS-960e PXI Express semiconductor test platform that features test capabilities for RF devices and SoC applications. It features 256 125-MHz digital I/O channels with per-pin-PMU, and multiple RF and analog test instruments in a single, 21-slot PXIe chassis. It incorporates the GX5296 digital subsystem, software test suite, and RF instrumentation option.

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NASA Tech Briefs Magazine

This article first appeared in the November, 2016 issue of NASA Tech Briefs Magazine.

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