Pasternack, Irvine, CA, offers semi-rigid test probes for testing microwave circuits. By soldering the outer conductor to the signal ground and the exposed center conductor to the trace carrying the signal of interest, sampling measurements can be made without creating a separate subassembly circuit board or adding a connector to the circuit layout. The probes are offered in three diameters of semi-rigid coax: 0.02", 0.034", and 0.047".

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NASA Tech Briefs Magazine

This article first appeared in the November, 2016 issue of NASA Tech Briefs Magazine.

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