CSAM Metrology Software Tool (CMeST) is a computer program for analysis of false-color CSAM images of plastic-encapsulated microcircuits. ("CSAM" signifies C-mode scanning acoustic microscopy.) The colors in the images indicate areas of delamination within the plastic packages. Heretofore, the images have been interpreted by human examiners.
Hence, interpretations have not been entirely consistent and objective. CMeST processes the color information in image-data files to detect areas of delamination without incurring inconsistencies of subjective judgement. CMeST can be used to create a database of baseline images of packages acquired at given times for comparison with images of the same packages acquired at later times. Any area within an image can be selected for analysis, which can include examination of different delamination types by location. CMeST can also be used to perform statistical analyses of image data. Results of analyses are available in a spreadsheet format for further processing. The results can be exported to any data-base processing software.
This program was written by Duc Vu, Michael Sandor, and Shri Agarwal of Caltech for NASA's Jet Propulsion Laboratory. For further information, access the Technical Support Package (TSP) free online at www.techbriefs.com/tsp under the Software category.
This software is available for commercial licensing. Please contact Karina Edmonds of the California Institute of Technology at (818) 393-2827. Refer to NPO-40475.
This Brief includes a Technical Support Package (TSP).
CSAM Metrology Software Tool
(reference NPO-40475) is currently available for download from the TSP library.
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