Signal- and image-processing methods are commonly needed to extract information from the waves, improve resolution of, and highlight defects in an image. Since some similarity exists for all waveform-based nondestructive evaluation (NDE) methods, it would seem that a common software platform containing multiple signal- and image-processing techniques to process the waveforms and images makes sense where multiple techniques, scientists, engineers, and organizations are involved.

NDE Wave & Image Processor Version 2.0 software provides a single, integrated signal- and image-processing and analysis environment for total NDE data processing and analysis. It brings some of the most useful algorithms developed for NDE over the past 20 years into a commercial-grade product. The software can import signal/spectroscopic data, image data, and image series data.

This software offers the user hundreds of basic and advanced signal- and image-processing capabilities including esoteric 1D and 2D wavelet-based de-noising, de-trending, and filtering. Batch processing is included for signal- and image-processing capability so that an optimized sequence of processing operations can be applied to entire folders of signals, spectra, and images. Additionally, an extensive interactive model-based curve-fitting facility has been included to allow fitting of spectroscopy data such as from Raman spectroscopy. An extensive joint-time frequency module is included for analysis of non-stationary or transient data such as that from acoustic emission, vibration, or earthquake data.

This work was done by Don J. Roth of Glenn Research Center. For more information, download the Technical Support Package (free white paper) at under the Software category.

Inquiries concerning rights for the commercial use of this invention should be addressed to

NASA Glenn Research Center
Innovative Partnerships Office
Attn: Steve Fedor
Mail Stop 4–8
21000 Brookpark Road
Ohio 44135.

Refer to LEW-18460-1.

NASA Tech Briefs Magazine

This article first appeared in the October, 2010 issue of NASA Tech Briefs Magazine.

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