altKeithley Instruments, Inc. (Cleveland, OH) has introduced seven instrumentation, software, and test fixture configurations for parametric curve tracing applications for characterizing high power devices at up to 3,000V and 100A, including those based on silicon carbide (SiC) and gallium nitride (GaN) technology. These systems offer the power required for the vast majority of high power device design and development applications, and are optimized to address the characterization and test needs of research, reliability, failure analysis, and power device applications engineers; power device designers; incoming inspection technicians; and many others. All seven configurations include the latest version of Keithley’s ACS (Automated Characterization Suite) Basic Edition software, which supports Keithley’s newest SMUs and takes maximum advantage of the Series 2600B’s TSP-Link connection trigger model, which allows for 500ns trigger synchronization between instruments.

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