Lecroy® Corporation (Chestnut Ridge, NY) has introduced a 13 GHz test system comprised of the SDA 13000 Serial Data Analyzer, the D13000PS Active Differential Probe, and a suite of debug and analysis tools. The new system provides powerful methods for next-generation serial data bus design, development, and debug.

With a 40 GS/s sample rate and 100Mpts/ch memory, LeCroy's SDA13000 troubleshoots physical layer problems during development, and delivers a solution for compliance and debug testing of next-generation serial data standards such as FBDIMM, Fibre Channel, SAS, SATA, InfiniBand, and PCI-Express. The latest emerging technology is PCI-Express Gen 2, which functions as a highspeed interconnect between the CPU and its peripherals. PCI-Express Gen 2 is primarily used in servers, workstations, PCs, laptops, and mobile devices.

Debug tools include an eye violation locator and Intersymbol Interference (ISI) plot to understand which bit or bit combination is contributing the most errors. Other tools include a periodic jitter (PJ) breakdown feature to understand the contributing sources of the most periodic jitter to the total jitter. Eye Doctor, Wavescan, and 8b/10b decode and search capabilities further the SDA13000's serial data solutions.

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This article first appeared in the January, 2008 issue of Embedded Technology Magazine.

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