Optical Monitoring System

SpectraLock Optical Monitoring System
SpectraLock Optical Monitoring System
Eddy Company (Apple Valley, CA)

The SpectraLock Optical Monitoring System from Eddy Company (Apple Valley, CA) provides in-situ monitoring and deposition rate control to produce single- and multi-layered thin films with exacting accuracy, time after time, without iteration or error. Eddy Company's advanced system produces optical coatings to the precise specifications of the original optical design because of its index dispersion enhanced optical monitoring (IDEM) features. Using SpectraLock, a single test run can confirm that the coating matches its design, instead of the traditional method of performing multiple test runs until a coating iteration comes close to matching the design.

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3D Machine Vision Camera

3DPIXA dual 200 μm HR
3DPIXA dual 200 μm HR
Chromasens (Poway, CA)

Chromasens (Poway, CA) has extended its popular 3DPIXA family of high-performance 3D line scan cameras with a new model that provides a 55-inch FOV (field-of-view) for complete high-speed scans of large, complex and irregularly-shaped objects. The 3DPIXA dual 200 μm HR employs factory-calibrated stereo cameras that enable the simultaneous acquisition of 2D color images along with either a height map or 3D point cloud.

Other key features of the 3DPIXA dual 200 μm HR are: 5940 mm/s maximum speed for image acquisition (19.48 ft/s); height resolution up to 60 micron, range up to 400mm; 10 μm × 10 μm (10 μm pitch) pixel size; 7296 pixels per line (29.7 kHz line frequency); throughput up to 6.8 Gbit/s or 850 MB/s. Adding to its ease of use is support for libraries from HALCON (MVTec), MIL (Matrox), LabVIEW (National Instruments), and Coake (SAC), along with Chromasens' own 3D-API.

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Optical Design Software

VPIphotonics Design Suite
VPIphotonics Design Suite
VPIphotonics (Berlin, Germany)

VPIphotonics Design Suite from VPIphotonics (Berlin, Germany) provides access to professional application-specific simulation and design tools for optical components and transmission systems with common usability, design process and data analysis capabilities.

Version 9.9 comes with enhancements of the user interface and tools operation, as well as advances in simulation capabilities, such as new design and analysis tools for coherent M-QAM and direct-detection PAM-M systems, new and enhanced DSP and coding functionalities, extended library of PIC elements and instrumentations, to continuously support VPIphotonics’ existing applications and markets and addressing new ones.

The simulation tool suite provides access to over 850 ready-to-run demonstrations, including new ones illustrating the novel functions and applications available in Version 9.9, such as probabilistic shaping, PAM-4 for interconnects, multimode VCSEL transmission, nonlinear Volterra filtering.

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Wide-Field Hyperspectral Camera

SpectraLock Optical Monitoring System
Model 4200 Wide-Field Hyperspectral Camera
HinaLea Imaging (Emeryville, CA)

HinaLea Imaging (Emeryville, CA) announced the launch of a new Model 4200 Wide-Field Hyperspectral Camera suitable for a wide range of laboratory and industrial applications, ranging from basic scientific and biomedical research to industrial uses. The instrument can identify specific components and materials as well as verification of product quality/identification of defects (color matching, trueness and uniformity). Features of the Model 4200 include: contiguous, high-resolution imaging; wavelength selectivity; staring hyperspectral imaging; true hyperspectral imaging; and customizability.

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XY Alignment Stage

AU200-50 × 50-SC Alignment Stage
AU200-50 × 50-SC Alignment Stage
Optimal Engineering Systems, Inc. (OES) (Van Nuys, CA)

The AU200-50 × 50-SC Alignment Stage from Optimal Engineering Systems, Inc. (OES) (Van Nuys, CA) is a high-resolution, high-repeatability XY stage for such applications as: alignment, assembly, laser drilling, machining, medical, industrial, semiconductor handling, testing, scanning, and optical applications. The linear travel of the X and Y axes is 50 mm × 50 mm, and the resolution of each axis is 5 microns (non-micro-step) or 0.125 microns (with 20 micro-steps per step motor driver in use), repeatability is 1.5 microns, and positional accuracy is 5 microns. The 1 mm per-turn lead screws and preloaded V-groove and crossed roller bearings contribute to the high precision and stiffness of the AU200-50 × 50-SC Alignment Stage.

The XY table measures 155 mm × 155 mm and features a precision pattern of drilled and threaded mounting holes to facilitate the addition tooling or fixtures. A table with a large open aperture is also available. This low profile black anodized aluminum XY stage is easy to integrate into new or existing systems.

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Smart Line Scan Camera

RazerCam LS
RazerCam LS
EVT Eye Vision Technology (Karlsruhe, Germany)

The RazerCam LS from EVT Eye Vision Technology (Karlsruhe, Germany) is a smart line scan camera that is freely programmable under Linux OS. High data rates are supported by a powerful FPGA and the camera is optimized for high computing power and fast frame rates.

Resolutions of 2048 pixels with a line rate of up to 47 kHz can be reached. The whole application can be executed in the smart line scan camera RazerCam Z. The FPGA helps, in cases where the evaluation is getting complex. The evaluation is running only on the line scan camera and can be connected to the PC via remote access. The processor is based on the Xilinx Zynq (SoM) and transfers data at 400 MB per second between the programmable FPGA and the memory (RAM). In addition the camera has 4 inputs and 4 outputs as well as Power over Ethernet (PoE).

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Linear Measurement System

OptiCentric Linear
OptiCentric® Linear
TRIOPTICS (Wedel, Germany)

For two decades, the OptiCentric® measurement systems manufactured by TRIOPTICS (Wedel, Germany) required that the samples be measured on a precision rotation bearing. The use of such a rotation bearing typically necessitates a vertical measurement arrangement. Faced with this challenge, engineers at TRIOPTICS have now developed a centration inspection process that can perform a centration measurement without rotation and regardless of the sample position.

Called OptiCentric® Linear, the special feature of this inspection method lies in its use of the linear path of motion of the autocollimator focus – not the rotation axis – as the reference axis for measurement. The positions of the sample's centers of curvature are measured in relation to this focal position, making it possible to achieve accuracies of ≤ 1 micron during centration error measurement. This makes the orientation of the measurement setup freely selectable, and it can also be horizontal. The lack of rotation ensures the required speed for performing quality inspections in volume production.

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