Rudolph Technologies, Inc. (Wilmington MA) recently unveiled its new patented Clearfind™ technology, which can detect organic defects that are difficult or impossible to see with conventional white-light imaging techniques. Organic contaminants are often the root cause of field failures, which occur after the material has been exposed to operating conditions for extended periods.

Clearfind technology highlights organic residues on bumps and bond pads or at the bottoms of vias so that they are easy to detect. On metals, it eliminates the high-contrast graininess seen under conventional illumination, resulting in an obvious defect signal against a featureless background. This same graininess in conventional imaging can also cause false positives, which are especially costly at this stage of the process where the sunk cost of unnecessarily rejected good product is high.

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Photonics & Imaging Technology Magazine

This article first appeared in the November, 2016 issue of Photonics & Imaging Technology Magazine.

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