Luna Technologies (Roanoke, VA) has introduced the Optical Vector Analyzer platform, (OVA 5000), a tool for loss, dispersion, and polarization measurements of modern optical networking equipment. It delivers single- measurement, all-parameter analysis of fiber optic components and assemblies up to 150 meters in length. A full C and L band characterization of all linear optical parameters can be completed in less than three seconds. The OVA uses swept-wavelength interferometry to measure all device characteristics in a single scan of a tunable laser. It characterizes all linear optical parameters including: Insertion Loss (IL), Polarization Dependent Loss (PDL), Group Delay (GD), Chromatic Dispersion (CD), Polarization Mode Dispersion (PMD), and Second Order PMD.

For Free Info Click Here 

Photonics Tech Briefs Magazine

This article first appeared in the April, 2010 issue of Photonics Tech Briefs Magazine.

Read more articles from this issue here.

Read more articles from the archives here.