Mcpherson (Chelmsford, MA) has developed a 248/130 grazing incidence wavelength dispersive optical spectrometer that analyzes spectral light in the ~1 to 300 nm wavelength region (4 to ~1200 eV). It is useful for the vacuum ultraviolet as well as the extreme and soft X-ray wavelength region. Using direct detection CCDs, gated image intensifiers, or fast channel electron multipliers for detection, the instruments are vacuum leak checked and calibrated with respect to wavelength. Vacuum ultraviolet spectroscopy accessories, including various detector systems and wavelength calibration sources, are available from

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Photonics Tech Briefs Magazine

This article first appeared in the April, 2010 issue of Photonics Tech Briefs Magazine.

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