FEI (Hillsboro, OR) has released the PhenomTM microscope, bridging the performance gap between optical and scanning electron microscope (SEM) technologies. Capable of yielding magnification up to 20,000× — 20 times higher than most advanced optical scopes — and with an ultimate resolution of 30nm, the Phenom addresses a wide variety of industrial and academic applications including quality assurance, product development, research, and testing.

The Phenom system, which includes the imaging module; 15-inch touch screen monitor; rotary knob; diaphragm vacuum pump; single phase AC 110-240 volt, 50/60 Hz, 300W (max.) power supply; and 128 MB USB 2.0 flash drive, can accommodate sample sizes up to 25mm in diameter and 30mm high on a computer controlled motorized X and Y sample stage. Digital image detection in Light Optical mode is handled by a color CCD camera; in Electron Optical mode via a high sensitivity backscatter electron detector (multi-mode). Images can be saved in JPEG, TIFF, or BMP formats. Image resolution options include: 456×456, 684×684, 1024×1024, and 2048×2048 pixels.

For Free Info Visit http://info.ims.ca/10976-207

Photonics Tech Briefs Magazine

This article first appeared in the September, 2007 issue of Photonics Tech Briefs Magazine.

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